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Short-circuit protection and top-level optical cell quality | Europe

Short-circuit protection and top-level optical cell quality

Detecting compound spots and contamination on surfaces right after the printing process, before cell firing, is essential in order to produce A-level solar cells. ISRA SOLAR VISION offers a unique defect inspection system for compound spots on cell edges which will cause short-circuits when the cells enter the flashing process. Inspection at this stage helps to ensure level A quality for at least the next 400 cells. The new Solarscan-Bevel system prevents to manufacture scrap and gives the possibility to react immediately with protective or maintenance actions. The major benefits: solar cells with best-in-class optical quality and reduced machine downtime.

In order to optimize production efficiency, to increase machine uptimes and to reduce manufacturing costs, one major goal is to detect defects such as contamination and unclean coating in the manufacturing process as early and as fast as possible. Solarscan-Bevel inspects the cells after printing before firing. This enables manufacturers to clear compound spots on cell edges that could lead to short-circuits in all following cells. The additional benefit: the reliable inspection alarms the maintenance staff and signalizes that aged meshes have to be exchanged.

Cell edges are the most critical areas for compound spots because the pressure exerted on the mesh is extremely high. ISRA SOLAR VISION provides the optimum solution for this problem with its new inspection system especially designed for the early detection of edge defects such as contamination or spots. Being applied in every production line right after printing and before the firing process, Solarscan-Bevel enables the manufacturers to optimize their process and to avoid non-reparable defects. The huge advantage: material with short-circuits will not reach higher processing steps, hundreds of defective cells can be avoided and resources will be saved.
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Posted by Gloria Llopis | 2011-10-21